Analyzing refractive index profiles of confined fluids by interferometry.

This work describes an interferometry data analysis method for determining the optical thickness of thin films or any variation in the refractive index of a fluid or film near a surface. In particular, the method described is applied to the analysis of interferometry data taken with a surface force apparatus (SFA). The technique does not require contacting or confining the fluid or film. By analyzing interferometry data taken at many intersurface separation distances out to at least 300 nm, the properties of a film can be quantitatively determined. The film can consist of material deposited on the surface, like a polymer brush, or variation in a fluid's refractive index near a surface resulting from, for example, a concentration gradient, depletion in density, or surface roughness. The method is demonstrated with aqueous polyethylenimine (PEI) adsorbed onto mica substrates, which has a large concentration and therefore refractive index gradient near the mica surface. The PEI layer thickness determined by the proposed method is consistent with the thickness measured by conventional SFA methods. Additionally, a thorough investigation of the effects of random and systematic error in SFA data analysis and modeling via simulations of interferometry is described in detail.